| Title: |
High resolution positron-annihilation spectroscopy with a new positron microprobe |
| Author(s): |
H. Greif  , M. Haaks , U. Holzwarth, U. Männig , M. Tongbhoyai , T. Wider , K. Maier , J. Bihr and B. Huber |
| Journal: |
Appl. Phys. Lett. |
| Year: |
1997 |
| Volume: |
71 |
| Issue: |
15 |
| Pages: |
2115--2117 |
| DOI: |
10.1063/1.120451 |
| File URL: |
http://apl.aip.org/resource/1/applab/v71/i15/p2115_s1 |
| Abstract: |
In cooperation with Zeiss/LEO GmbH, a monoenergetic positron source has been integrated in the electron optical system of a scanning electron microscope by help of a magnetic prism, The electron optics serves both to image the specimen with electrons and to form a positron microbeam that allows local positron-annihilation measurements with a resolution in the micron range. The fatigue damage profile along the cross section of a copper plate after a three-point bending test has been investigated. The obtained S-parameter profile coincides well with the expected fatigue damage distribution. (C) 1997 American Institute of Physics. |
