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Title: High resolution positron-annihilation spectroscopy with a new positron microprobe
Author(s): H. Greif Person, M. Haaks Person, U. Holzwarth, U. Männig Person, M. Tongbhoyai Person, T. Wider Person, K. Maier Person, J. Bihr and B. Huber
Journal: Appl. Phys. Lett.
Year: 1997
Volume: 71
Issue: 15
Pages: 2115--2117
DOI: 10.1063/1.120451
File URL: http://apl.aip.org/resource/1/applab/v71/i15/p2115_s1
Abstract: In cooperation with Zeiss/LEO GmbH, a monoenergetic positron source has been integrated in the electron optical system of a scanning electron microscope by help of a magnetic prism, The electron optics serves both to image the specimen with electrons and to form a positron microbeam that allows local positron-annihilation measurements with a resolution in the micron range. The fatigue damage profile along the cross section of a copper plate after a three-point bending test has been investigated. The obtained S-parameter profile coincides well with the expected fatigue damage distribution. (C) 1997 American Institute of Physics.

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